CAM (Content Addressable Memory) units are generally designed so that they can be applied to variety of application programs. However, if a particular application runs on CAM units, some functions in CAM units may be often used and other functions may never be used. We consider that appropriate design for CAM units is required depending on the requirements for a given application program. This paper proposes a CAM processor synthesis system based on behavioral descriptions. The input of the system is an application program written in C including CAM functions, and its output is hardware descriptions of a synthesized processor and a binary code executed on it. Since the system determines functions in CAM units and synthesizes a CAM processor depending on the requirements of an application program, we expect that a synthesized CAM processor can execute the application program with small processor area and delay. Experimental results demonstrate its efficiency and effectiveness.

In this paper, we propose a reconfigurable adaptive FEC system. In adaptive FEC schemes, the error correction capability t is changed dynamically according to the communication channel condition. If a particular error correction capability t is given, we can implement an FEC decoder which is optimal for t by taking the number of operations into consideration. Thus, reconfiguring the optimal FEC decoder dynamically for each error correction capability allows us to maximize the throughput of each decoder within a limited hardware resource. Based on this concept, our reconfigurable adaptive FEC system can reduce the packet dropping rate more efficiently than conventional fixed hardware systems. We can improve data transmission throughput for a reliable transport protocol. Practical simulation results are also shown.

CAMs (Content Addressable Memories) are functional memories which have functions such as word-parallel equivalence search, bilateral 1-bit data shifting between consecutive words, and word-parallel writing. Since CAMs can be integrated because of their regular structure, massively parallel CAM functions can be executed. Taking advantage of CAMs, Ishiura and Yajima have proposed a parallel fault simulation algorithm using a CAM. This algorithm, however, requires a large amount of CAM storage to simulate large-scale circuits. In this paper, we propose a new massively parallel fault simulation algorithm requiring less CAM storage, and compare it with Ishiura and Yajima's algorithm. Experimental results of the algorithm on CHARGE --the CAM-based hardware engine developed in our laboratory--are also reported.

This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.

Test data volume and power consumption for scan-based designs are two major concerns in system-on-a-chip testing. However, test set compaction by filling the don't-cares will invariably increase the scan-in power dissipation for scan testing, then the goals of test data reduction and low-power scan testing appear to be conflicted. Therefore, in this paper we present a selective scan chain reconfiguration method for test data compression and scan-in power reduction. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. After the scan chain reconfiguration a dictionary is built to indicate the run-length of each compatible class and only the scan-in data for each class should be transferred from the ATE to the CUT so as to reduce test data volume. Experimental results for the larger ISCAS'89 benchmarks show that the proposed approach overcomes the limitations of traditional run-length coding techniques, and leads to highly reduced test data volume with significant power savings during scan testing in all cases.

At high-level synthesis for system VLSIs, their power consumption is efficiently reduced by applying gated clocks to them. Since using gated clocks causes the reduction of power consumption and the increase of area/delay, estimating trade-off between power and area/delay by applying gated clocks is very important. In this paper, we discuss the amount of variance of area, delay and power by applying gated clocks. We propose a simple gate-level circuit model and estimation equations. We vary parameters in our proposed circuit model, and evaluate power consumption by back-annotating gate-level simulation results to the original circuit. This paper also proposes a conditional expression for applying gated clocks. The expression shows whether or not we can reduce power consumption by applying gated clocks. We confirm the accuracy of proposed estimation equations by experiments.

Scan-based side-channel attacks retrieve a secret key in a cryptography circuit by analyzing scanned data. Since they must be considerable threats to a cryptosystem LSI, we have to protect cryptography circuits from them. RSA is one of the most important cryptography algorithms because it effectively realizes a public-key cryptography system. RSA is extensively used but conventional scan-based side-channel attacks cannot be applied to it because it has a complicated algorithm. This paper proposes a scan-based side-channel attack which enables us to retrieve a secret key in an RSA circuit. The proposed method is based on detecting intermediate values calculated in an RSA circuit. We focus on a 1-bit time-sequence which is specific to some intermediate values. By monitoring the 1-bit time-sequence in the scan path, we can find out the register position specific to the intermediate value and we can know whether this intermediate value is calculated or not in the target RSA circuit. We can retrieve a secret key one-bit by one-bit from MSB to LSB. The experimental results demonstrate that a 1,024-bit secret key used in the target RSA circuit can be retrieved using 30.2 input messages within 98.3 seconds and its 2,048-bit secret key can be retrieved using 34.4 input within 634.0 seconds.

Transport-processing FPGAs have been proposed for flexible telecommunication systems. Since those FPGAs have finer granularity of logic functions to implement circuits on them, the amount of routing resources tends to increase. In order to keep routing congstion small, it is necessary to execute placement and routing simultaneously. This paper proposes a simultaneous placement and global routing algorithm for transport-processing FPGAs whose primary objective is minimizing routing congestion. The algorithm is based on hierarchical bipartition of layout regions and sets of LUTs (Look Up Tables) to be placed. It achieves bipartitioning which leads to small routing congestion by applying a network flow technique to it and computing a maximum flow and a minimum cut. If there exist connections between bipartitioned LUT sets, pairs of pseudo-terminals are introduced to preserve the connections. A sequence of pseudo-terminals represents a global route of each net. As a result, both placement of LUTs and global routing are determined when hierarchical bipartitioning procedures are finished. The proposed algorithm has been implemented and applied to practical transport-processing circuits. The experimental results demonstrate that it decreases routing congestion by an average of 37% compared with a conventional algorithm and achieves 100% routing for the circuits for which the conventional algorithm causes unrouted nets.

In this paper, we present a test data compression technique to reduce test data volume for multiscan-based designs. In our method the internal scan chains are divided into equal sized groups and two dictionaries were build to encode either an entire slice or a subset of the slice. Depending on the codeword, the decompressor may load all scan chains or may load only a group of the scan chains, which can enhance the effectiveness of dictionary-based compression. In contrast to previous dictionary coding techniques, even for the CUT with a large number of scan chains, the proposed approach can achieve satisfied reduction in test data volume with a reasonable smaller dictionary. Experimental results showed the proposed test scheme works particularly well for the large ISCAS'89 benchmarks.